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IEC 62804-1-1 defines procedures to test and evaluate for potential-induceddegradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributableto current transfer between ground and the module cell circuit. Elements driving thedelamination that this test is designed to actuate include reduced adhesion associated withdamp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cellcircuit, metallization, and other components within the PV module activated by the voltagepotential. The change in power of crystalline silicon PV modules associated with the stressfactors applied (the purview of IEC TS 62804-1) is not considered in the scope.Modules are tested in a climactic chamber with damp heat and application of module-ratedsystem voltage to the cell circuit in each polarity that is specified or allowed in the moduledocumentation. This document does not differentiate the effects of some construction methodsof mitigating PID-for example, the use of rear rail mounts, edge clips, and insulating framesthat may serve to electrically isolate the module faces to varying extents. The actual durabilityof modules to system voltage stress will depend on the mounting design and the environmentalconditions under which the modules are operated. These tests are intended to assess thesensitivity of the PV module laminate to PID-d irrespective of actual stresses under operationin different climates and systems.
||Fotovoltaïsche (PV) modules - Testmethoden voor de detectie van maximaal-geïnduceerde afbraak - Deel 1-1: Kristallijn silicium - Delaminatie
||Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination