Standard

NEN-EN-ISO 9220:1994 en

Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

34,41 41,64 Incl BTW

About norm

Status Current
Number of pages 5
Committee Metallieke deklagen
Published on 01-12-1994
Language English
Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainly of less than 10% or 0,1/┬Ám, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a light microscope.

Details

ICS-code 25.220.40
Dutch title Metallieke deklagen - Metingen van de laagdikte - Methode door scannen met een elektronenmicroscoop
English title Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

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