Standard

NEN-IEC 62951-3:2018 en

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

145,59 158,69 Incl BTW

About norm

Status Current
Number of pages 22
Committee Halfgeleiders
Published on 01-11-2018
Language English
NEN-IEC 62951-3 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment

Details

ICS-code 31.080.99
English title Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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