|Number of pages||27|
This International Standard is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
|Dutch title||Chemische analyse van oppervlakken - Röntgenfotoelektronenspectrometers - Richtlijnen voor analyse|
|English title||Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis|