Norm

ASTM E1078 - 09 en

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

  • Deze norm is ingetrokken sinds 01-10-2014

50,60 61,23 Incl BTW

Over deze norm

Status Ingetrokken
Aantal pagina's 10
Gepubliceerd op 01-05-2009
Taal Engels

1.1 This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS and ESCA), and

1.1.3 Secondary ion mass spectrometry, (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Details

ICS-code 71.040.50
Engelse titel Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Vervangen door

Winkelwagen

Subtotaal:

Ga naar winkelwagen