Norm

ASTM E1426-14

Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques

54,27

Over deze norm

Status Definitief
Aantal pagina's 6
Commissie E28.13
Gepubliceerd op 01-12-2014
Taal Engels

1.1 This test method covers a procedure for experimentally determining the x-ray elastic constants (XEC) for the evaluation of residual and applied stresses by x-ray diffraction techniques. The XEC relate macroscopic stress to the strain measured in a particular crystallographic direction in polycrystalline samples. The XEC are a function of the elastic modulus, Poisson’s ratio of the material and the hkl plane selected for the measurement. There are two XEC that are referred to as 1/2 S2hkl and S1 hkl.

1.2 This test method is applicable to all x-ray diffraction instruments intended for measurements of macroscopic residual stress that use measurements of the positions of the diffraction peaks in the high back-reflection region to determine changes in lattice spacing.

1.3 This test method is applicable to all x-ray diffraction techniques for residual stress measurement, including single, double, and multiple exposure techniques.

1.4 The values stated in SI units are to be regarded as standard. The values given in parentheses are mathematical conversions to inch-pound units that are provided for information only and are not considered standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Details

ICS-code 71.040.50
Nederlandse titel Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
Engelse titel Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques

Winkelwagen

Subtotaal:

Ga naar winkelwagen