Norm

ASTM E1829-14

Standard Guide for Handling Specimens Prior to Surface Analysis

54,27

Over deze norm

Status Definitief
Aantal pagina's 5
Commissie E42.03
Gepubliceerd op 01-10-2014
Taal Engels

1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1 Auger electron spectroscopy (AES),

1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3 Secondary ion mass spectrometry (SIMS).

1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Details

ICS-code 71.040.50
Nederlandse titel Standard Guide for Handling Specimens Prior to Surface Analysis
Engelse titel Standard Guide for Handling Specimens Prior to Surface Analysis

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