Norm

ASTM E2444 - 05e1 en

Terminology Relating to Measurements Taken on Thin, Reflecting Films

  • Deze norm is ingetrokken sinds 15-10-2011

45,11 54,58 Incl BTW

Over deze norm

Status Ingetrokken
Aantal pagina's 3
Gepubliceerd op 01-05-2005
Taal Engels

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

Details

Engelse titel Terminology Relating to Measurements Taken on Thin, Reflecting Films
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