Norm

ASTM E2444-11e1

Terminology Relating to Measurements Taken on Thin, Reflecting Films

48,24

Over deze norm

Status Definitief
Aantal pagina's 2
Commissie E08.02
Gepubliceerd op 15-10-2011
Taal Engels

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

Details

ICS-code 01.040.31
31.240
Nederlandse titel Terminology Relating to Measurements Taken on Thin, Reflecting Films
Engelse titel Terminology Relating to Measurements Taken on Thin, Reflecting Films

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