Over deze norm
1.1 This test method describes an accurate technique for measuring the normal spectral emittance of electrically nonconducting materials in the temperature range from 1000 to 1800 K, and at wavelengths from 1 to 35 μm. It is particularly suitable for measuring the normal spectral emittance of materials such as ceramic oxides, which have relatively low thermal conductivity and are translucent to appreciable depths (several millimetres) below the surface, but which become essentially opaque at thicknesses of 10 mm or less.
1.2 This test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is particularly suitable for research laboratories, where the highest precision and accuracy are desired, and is not recommended for routine production or acceptance testing. Because of its high accuracy, this test method may be used as a reference method to be applied to production and acceptance testing in case of dispute.
1.3 This test method requires the use of a specific specimen size and configuration, and a specific heating and viewing technique. The design details of the critical specimen furnace are presented in Ref (1), and the use of a furnace of this design is necessary to comply with this test method. The transfer optics and spectrophotometer are discussed in general terms.
1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
|Engelse titel||Standard Test Method for Normal Spectral Emittance at Elevated Temperatures of Nonconducting Specimens|