Norm

ASTM E673 - 03 en

Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

50,60 61,23 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 10
Gepubliceerd op 01-12-2003
Taal Engels

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Details

ICS-code 01.040.17 * 17.040.20
Engelse titel Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

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