Norm

ASTM F1262M - 95(2008) en

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

  • Deze norm is ingetrokken sinds 01-06-2014

50,60 61,23 Incl BTW

Over deze norm

Status Ingetrokken
Aantal pagina's 5
Gepubliceerd op 15-06-2008
Taal Engels

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Details

ICS-code 031.200
Engelse titel Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
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