Norm

ASTM F1893-11

Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

54,27

Over deze norm

Status Definitief
Aantal pagina's 7
Commissie F01.11
Gepubliceerd op 01-01-2011
Taal Engels

1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.

1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

Details

ICS-code 31.080.01
Nederlandse titel Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Engelse titel Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

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