Over deze norm
1.1 This guide defines the detailed requirements for testing semiconductor devices for short-pulse high dose-rate ionization-induced survivability and burnout failure. The test facility shall be capable of providing the necessary dose rates to perform the measurements. Typically, large flash X-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are utilized because of their high dose-rate capabilities. Electron Linear Accelerators (LINACs) may be used if the dose rate is sufficient. Two modes of test are described: (1) A survivability test, and (2) A burnout failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
|Nederlandse titel||Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices|
|Engelse titel||Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices|