Norm

ASTM F744M-16

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

49,88

Over deze norm

Status Definitief
Aantal pagina's 7
Commissie F01.11
Gepubliceerd op 01-05-2016
Taal Engels

1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).

1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation.

1.3 The test may be destructive either for further tests or for purposes other than this test if the integrated circuit being tested absorbs a total radiation dose exceeding some predetermined level. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test (6.8).

1.4 Setup, calibration, and test circuit evaluation procedures are included in this test method.

1.5 Procedures for lot qualification and sampling are not included in this test method.

1.6 Because of the variability of the response of different device types, the initial dose rate and device upset conditions for any specific test is not given in this test method but must be agreed upon by the parties to the test.

1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Details

Nederlandse titel Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
Engelse titel Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

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