Over deze norm
The intent of the tests described is to establish standard test procedures for semiconductor detectors in use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. The tests are concerned with resolutionmeasurements, noise measurements, determination of sensitivity to ambient conditions, and some other mesasurements. Annex A gives symbols and a glossary, annex B contains general information concerning semiconductor charged-particle detectors.
||Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures