Norm

IEC 60333:1993 en;fr

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

  • Deze norm is ingetrokken sinds 27-08-2010

174,49

Over deze norm

Status Ingetrokken
Aantal pagina's 76
Commissie Kerntechnische instrumentatie
Gepubliceerd op 01-07-1993
Taal Engels, Frans
The intent of the tests described is to establish standard test procedures for semiconductor detectors in use for the detection and high-resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. The tests are concerned with resolutionmeasurements, noise measurements, determination of sensitivity to ambient conditions, and some other mesasurements. Annex A gives symbols and a glossary, annex B contains general information concerning semiconductor charged-particle detectors.

Details

ICS-code 27.120.10
Nederlandse titel Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Engelse titel Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

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