Norm

IEC 60747-12:1991 en;fr

Semiconductor devices - Part 12: sectional specification for optoelectronic devices

  • Deze norm is ingetrokken sinds 01-03-2005

83,09

Over deze norm

Status Ingetrokken
Aantal pagina's 39
Commissie Halfgeleiders
Gepubliceerd op 01-08-1991
Taal Engels, Frans
Describes quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures. Refers to IEC 747-10/QC 700000.

Details

ICS-code 31.260
Nederlandse titel Semiconductor devices - Part 12: sectional specification for optoelectronic devices
Engelse titel Semiconductor devices - Part 12: sectional specification for optoelectronic devices

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