Norm

IEC 60747-7-4:1991 en;fr

Semiconductor devices - Discrete devices - Part 7: bipolar transistors - Section 4: blank detail specification for case-rated bipolar transistors for high-frequency amplification

  • Deze norm is ingetrokken sinds 01-08-2007

66,47

Over deze norm

Status Ingetrokken
Aantal pagina's 33
Commissie Halfgeleiders
Gepubliceerd op 01-07-1991
Taal Engels, Frans
Defines quality assessment procedures in such a manner that electronic components are acceptable in all other participating countries without the need for further testing. Refers to IEC 747-10/QC 700000 and IEC 747-11/QC 750100.

Details

ICS-code 31.240
Nederlandse titel Semiconductor devices - Discrete devices - Part 7: bipolar transistors - Section 4: blank detail specification for case-rated bipolar transistors for high-frequency amplification
Engelse titel Semiconductor devices - Discrete devices - Part 7: bipolar transistors - Section 4: blank detail specification for case-rated bipolar transistors for high-frequency amplification

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