Norm

IEC 60747-8-1:1987 en;fr

Semiconductor devices - Discret devices - Part 8: Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz.

  • Deze norm is ingetrokken sinds 01-08-2007

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Over deze norm

Status Ingetrokken
Aantal pagina's 0
Commissie Halfgeleiders
Gepubliceerd op 01-12-1987
Taal Engels, Frans
Applicable to quality assessment for field-effect transistors. Gives specific requirements (included in QC 750112 of the IECQ system), represents the blank detail specification for single-gate field-effect transistors up to 5 W and 1 GHz.

Details

ICS-code 31.080.30
Nederlandse titel Semiconductor devices - Discret devices - Part 8: Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz.
Engelse titel Semiconductor devices - Discret devices - Part 8: Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz.

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