Norm

IEC 60747-8-2:1993 en;fr

Semicoductor devices - Discrete devices - Part 8: field-effect transistors - Section 2: blank detail specification for field-effect transistors for case-rated power amplifier applications

  • Deze norm is ingetrokken sinds 28-07-2016

66,47

Over deze norm

Status Ingetrokken
Aantal pagina's 35
Commissie Halfgeleiders
Gepubliceerd op 01-02-1993
Taal Engels, Frans
The IEC quality assessment system for electronic components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of anapplicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification shall be used with IEC publications 747-10/QC 700000 (1991) and 747-11/QC 750100 (1985).

Details

ICS-code 31.240
Nederlandse titel Semicoductor devices - Discrete devices - Part 8: field-effect transistors - Section 2: blank detail specification for field-effect transistors for case-rated power amplifier applications
Engelse titel Semicoductor devices - Discrete devices - Part 8: field-effect transistors - Section 2: blank detail specification for field-effect transistors for case-rated power amplifier applications

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