Norm

IEC 60747-8-3:1995 en;fr

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field-effect transistors for switching applications

  • Deze norm is ingetrokken sinds 28-07-2016

83,09

Over deze norm

Status Ingetrokken
Aantal pagina's 37
Commissie Halfgeleiders
Gepubliceerd op 01-04-1995
Taal Engels, Frans
The object of the quality assessment system for electronic components is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semi-conducter devices.

Details

ICS-code 31.240
Nederlandse titel Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field-effect transistors for switching applications
Engelse titel Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field-effect transistors for switching applications

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