Norm

IEC 60748-11-1:1992 en;fr

Semiconductor devices - Integrated circuits - Part 11 - Section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits

174,49

Over deze norm

Status Definitief
Aantal pagina's 71
Commissie Halfgeleiders
Gepubliceerd op 01-04-1992
Taal Engels, Frans
Purpose of the tests is to check the internal materials, construction and workmanship for compliance with the requirements of the applicable specification. The tests will normally be used prior to capping or encapsulation on a 100 % inspection basis to detect and eliminate device with internal defects. They may also be employed on a sampling basis prior to capping to determine the effectiveness of the manufacturer's quality control and handling procedures.

Details

ICS-code 31.200
Nederlandse titel Semiconductor devices - Integrated circuits - Part 11 - Section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Engelse titel Semiconductor devices - Integrated circuits - Part 11 - Section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits

Winkelwagen

Subtotaal:

Ga naar winkelwagen