Norm

IEC 60748-20-1:1994 en;fr

Semiconductor devices - Integrated circuits - Part 20: generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: requirements for internal visual examination

141,25

Over deze norm

Status Definitief
Aantal pagina's 55
Commissie Halfgeleiders
Gepubliceerd op 01-02-1994
Taal Engels, Frans
The purpose is to check the internal materials, construction and workmanship of film and hybrid integrated circuits. These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier.

Details

ICS-code 31.200
Nederlandse titel Semiconductor devices - Integrated circuits - Part 20: generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: requirements for internal visual examination
Engelse titel Semiconductor devices - Integrated circuits - Part 20: generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: requirements for internal visual examination

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