Norm

IEC 60748-2-7:1992 en;fr

Semiconductor devices - Integrated circuits - Part 2: digital integrated circuits - Section 7: blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories

108,02

Over deze norm

Status Definitief
Aantal pagina's 41
Commissie Halfgeleiders
Gepubliceerd op 01-10-1992
Taal Engels, Frans
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: marking and ordering, application related description, specification of the function, limiting values, operating conditions, electrical characteristics, programming, additional information, screening and quality assessment procedures, test conditions and inspection requirements, and an additional measurement method(for PROM memories). Shall be used with IEC 747-10/QC 700000 and 748-11/QC 790100.

Details

ICS-code 31.200
Nederlandse titel Semiconductor devices - Integrated circuits - Part 2: digital integrated circuits - Section 7: blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
Engelse titel Semiconductor devices - Integrated circuits - Part 2: digital integrated circuits - Section 7: blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories

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