Norm

IEC 60748-2-9:1994 en;fr

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories

124,64

Over deze norm

Status Definitief
Aantal pagina's 47
Commissie Halfgeleiders
Gepubliceerd op 01-12-1994
Taal Engels, Frans
Defines, in compliance with the IEC Quality Assessment System for Electronic Components, information to be given for: mechanical description, short description, categories of assessed quality, reference data, marking and ordering, application related description, specification of the function, limiting values, operatingconditions, electrical characteristics, programming, additional information, screening procedure, quality assessment procedures, test conditions and inspection requirements, additional measurement method, programming and erasing. Shall be used with IEC 747-10/QC 700000 (1991) and 748-11/QC 790100 (1990).

Details

ICS-code 31.200
Nederlandse titel Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories
Engelse titel Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories

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