Norm

IEC 60749-20:2020-RL en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 20: Weerstand van kunststof behuizing SMDs tegen het gecombineerde effect van vocht en soldeerhitte (Redline versie met trackchanges)

210,03 228,93 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 82
Commissie Halfgeleiders
Gepubliceerd op 01-08-2020
Taal Engels, Frans
IEC 60749-20 provides a means of assessing the resistance to soldering heat ofsemiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test isdestructive. - THIS REDLINE VERSION PROVIDES YOU WITH QUICK AND EASY WAY TO COMPARE ALL THE CHANGES BETWEEN THIS STANDARD AND ITS PREVIOUS EDITION. A VERTICAL BAR APPEARS IN THE MARGIN WHEREVER A CHANGE HAS BEEN MADE. ADDITIONS AND DELETIONS ARE DISPLAYED IN RED, WITH DELETIONS BEING STRUCK THROUGH.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 20: Weerstand van kunststof behuizing SMDs tegen het gecombineerde effect van vocht en soldeerhitte (Redline versie met trackchanges)
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (Redline version with trackchanges)

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