Norm

IEC 60749-23:2004+A1:2011 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 23: Levensduur bij hoge temperatuur

54,01

Over deze norm

Status Definitief
Aantal pagina's 12
Commissie Halfgeleiders
Gepubliceerd op 01-03-2011
Taal Engels
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as “burn-in”, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this standard.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 23: Levensduur bij hoge temperatuur
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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