Norm

IEC 60749-27:2003 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 27: Elektrostatische ontlading (ESD) gevoeligheidsbeproeving - Machine-model (MM)

  • Deze norm is ingetrokken sinds 01-07-2006

41,55

Over deze norm

Status Ingetrokken
Aantal pagina's 25
Commissie Halfgeleiders
Gepubliceerd op 01-10-2003
Taal Engels, Frans
Establishes a standard procedure for testing and classifying semiconductor devices addording to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test metho d or the human body model (see IEC 60749-26).

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 27: Elektrostatische ontlading (ESD) gevoeligheidsbeproeving - Machine-model (MM)
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Vervangt

Winkelwagen

Subtotaal:

Ga naar winkelwagen