Norm

IEC 60749-30:2020 en;fr

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

64,48 70,28 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 26
Commissie Halfgeleiders
Gepubliceerd op 01-08-2020
Taal Engels, Frans
IEC 60749-30 establishes a standard procedure for determining the preconditioningof non-hermetic surface mount devices (SMDs) prior to reliability testing.The test method defines the preconditioning flow for non-hermetic solid-state SMDsrepresentative of a typical industry multiple solder reflow operation.These SMDs are subjected to the appropriate preconditioning sequence described in thisdocument prior to being submitted to specific in-house reliability testing (qualification and/orreliability monitoring) in order to evaluate long term reliability (impacted by soldering stress).

Details

ICS-code 31.080.01
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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