Norm

IEC 60759:1983 en;fr

Standard test procedures for semiconductor X-ray energy spectrometers

Volledig inclusief:

191,11

Over deze norm

Status Definitief
Aantal pagina's 97
Commissie Kerntechnische instrumentatie
Gepubliceerd op 01-01-1983
Taal Engels, Frans
Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Test procedures for pulse-height analyzers and computers are not covered in this standard. Companion publications are IEC Publications 333, 340 and 656. Test procedures are primarily concerned with: energy resolution and spectral distortion,pulse-height linearity, count-rate effects, overload effects, pulse height stability, efficiency.

Details

ICS-code 17.240
Nederlandse titel Standard test procedures for semiconductor X-ray energy spectrometers
Engelse titel Standard test procedures for semiconductor X-ray energy spectrometers
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