Norm

IEC 61189-5-503:2017 en

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

116,33

Over deze norm

Status Definitief
Aantal pagina's 23
Commissie Halfgeleiders
Gepubliceerd op 01-05-2017
Taal Engels
IEC 61189-5-503 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperaturehumidity cyclic test and an unsaturated pressurized vapour test (HAST).

Details

ICS-code 31.180
Engelse titel Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

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