Norm

IEC 61967-4:2002+A1:2006 en;fr

Ge├»ntegreerde schakelingen - Universele beproevingsplaat voor EMC-meting - Deel 4: Metingen van geleide emissies - 1Ω/150 directe koppelingsmethode

216,04

Over deze norm

Status Definitief
Aantal pagina's 65
Commissie Halfgeleiders
Gepubliceerd op 01-07-2006
Taal Engels, Frans
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 resistive probe and RF voltage measurement using a 150 coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.

Details

ICS-code 31.200
Nederlandse titel Ge├»ntegreerde schakelingen - Universele beproevingsplaat voor EMC-meting - Deel 4: Metingen van geleide emissies - 1Ω/150 directe koppelingsmethode
Engelse titel Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions 1 Ω/150 Ω direct coupling method
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