Norm

IEC 61967-6:2002+A1:2008 en

Geïntegreerde schakelingen - Universele beproevingsplaat voor EMC-meting - Deel 6: Metingen van geleide emissies - Magnetische methode

274,20

Over deze norm

Status Definitief
Aantal pagina's 87
Commissie Halfgeleiders
Gepubliceerd op 01-03-2008
Taal Engels
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method".

Details

ICS-code 31.200
Nederlandse titel Geïntegreerde schakelingen - Universele beproevingsplaat voor EMC-meting - Deel 6: Metingen van geleide emissies - Magnetische methode
Engelse titel Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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