Norm

IEC 62373-1:2020 en;fr

Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

133,57 145,59 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 44
Commissie Halfgeleiders
Gepubliceerd op 01-07-2020
Taal Engels, Frans
IEC 62373-1 provides the measurement procedure for a fast BTI (bias temperatureinstability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).This document also defines the terms pertaining to the conventional BTI test method.

Details

ICS-code 31.080.30
Engelse titel Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Winkelwagen

Subtotaal:

Ga naar winkelwagen