Norm

IEC 62435-2:2017 en;fr

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

83,09

Over deze norm

Status Definitief
Aantal pagina's 36
Commissie Halfgeleiders
Gepubliceerd op 01-01-2017
Taal Engels, Frans
IEC 62435-2 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1 for any device longterm storage whose duration may be more than 12 months for product scheduled for long duration storage. Mechanisms that apply to specific component types are detailed in IEC 62435-5 to IEC 62435-9 (proposed).

Details

ICS-code 31.020
Nederlandse titel Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Engelse titel Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

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