Norm

IEC 62899-402-1:2017 en

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

16,62

Over deze norm

Status Definitief
Aantal pagina's 12
Gepubliceerd op 01-03-2017
Taal Engels
IEC 62899-402-1 specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

Details

ICS-code 31.180
Nederlandse titel Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width
Engelse titel Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

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