Over deze norm
IEC 62899-402-1 specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
|Engelse titel||Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width|