Norm

IEC/PAS 62162:2000 en

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

9,97

Over deze norm

Status Definitief
Aantal pagina's 4
Commissie Halfgeleiders
Gepubliceerd op 01-08-2000
Taal Engels
All packaged semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according tot this standard.

Details

ICS-code 31.080.01
Nederlandse titel Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Engelse titel Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

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