Norm

IEC/PAS 62164:2000 en

Guidelines for GaAs MMIC and FET life testing

  • Deze norm is ingetrokken sinds 01-05-2004

24,93

Over deze norm

Status Ingetrokken
Aantal pagina's 16
Commissie Halfgeleiders
Gepubliceerd op 01-08-2000
Taal Engels
Life test are run for purposes. Tests run to detect the level of infant mortality involve short time durations: unless the percentage of devices having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted by or for a customer, here the stress and test conditions may be specific to the applications.

Details

ICS-code 31.080.01
Nederlandse titel Guidelines for GaAs MMIC and FET life testing
Engelse titel Guidelines for GaAs MMIC and FET life testing

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