Norm

IEC/TR 62878-2-2:2015 en;fr

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

49,85

Over deze norm

Status Definitief
Aantal pagina's 29
Commissie Halfgeleiders
Gepubliceerd op 01-12-2015
Taal Engels, Frans
IEC 62878-2-2 which is a Technical Report, describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components. The IEC 62878 series does not apply to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.

Details

ICS-code 31.180
31.190
Nederlandse titel Device embedded substrate - Part 2-2: Guidelines - Electrical testing
Engelse titel Device embedded substrate - Part 2-2: Guidelines - Electrical testing

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