Norm

IEC/TR 63133:2017 en

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

83,09 100,54 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 17
Commissie Halfgeleiders
Gepubliceerd op 01-10-2017
Taal Engels
IEC/TR 63133 specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Details

ICS-code 31.080.01
Engelse titel Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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