Norm

ISO 11775:2015 en

Chemische analyse van oppervlakken - Raster-probe microscopie - Bepaling van de veerconstante van de arm

98,05

Over deze norm

Status Definitief
Aantal pagina's 24
Gepubliceerd op 01-10-2015
Taal Engels
ISO 11775 describes five of the methods for the determination of normal spring constants for atomic force microscope cantilevers to an accuracy of 5 % to 10 %. Each method is in one of the three categories of dimensional, static experimental, and dynamic experimental methods. The method chosen depends on the purpose, convenience, and instrumentation available to the analyst. For accuracies better than 5 % to 10 %, more sophisticated methods not described here are required.

Details

ICS-code 71.040.40
Nederlandse titel Chemische analyse van oppervlakken - Raster-probe microscopie - Bepaling van de veerconstante van de arm
Engelse titel Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
Vervangt

Winkelwagen

Subtotaal:

Ga naar winkelwagen