Norm

ISO 15632:2002 en

Microstralenanalyse - Instrumentele specificatie voor energie-dispersieve röntgenspectrometers met halfgeleider diode detectoren

  • Deze norm is ingetrokken sinds 14-08-2012

48,19

Over deze norm

Status Ingetrokken
Aantal pagina's 8
Commissie Microstralen analyse
Gepubliceerd op 01-12-2002
Taal Engels
This International Standard defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. This International Standard specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.

Details

ICS-code 37.020
71.040.99
Nederlandse titel Microstralenanalyse - Instrumentele specificatie voor energie-dispersieve röntgenspectrometers met halfgeleider diode detectoren
Engelse titel Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Vervangt
Wordt vervangen door

Winkelwagen

Subtotaal:

Ga naar winkelwagen