Norm

ISO 15932:2013 en

Microstralenanalyse - Analytische elektronenmicroscopie - Woordenlijst

98,05

Over deze norm

Status Definitief
Aantal pagina's 21
Commissie Microstralen analyse
Gepubliceerd op 15-12-2013
Taal Engels
ISO 15932 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Details

ICS-code 01.040.37
37.020
Nederlandse titel Microstralenanalyse - Analytische elektronenmicroscopie - Woordenlijst
Engelse titel Microbeam analysis - Analytical electron microscopy - Vocabulary
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