Over deze norm
ISO 17862 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-offlight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its deadtime. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. This International Standard can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.
|Nederlandse titel||Chemische analyse van oppervlakken - Secundaire ionen-massaspectrometrie - Lineariteit van de intensiteitsschaal van 'single ion counting time-of-flight massa analysers'|
|Engelse titel||Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers|