Norm

ISO 19830:2015 en

Chemische analyse van oppervlakken - Electron spectroscopies - Mimimale eisen voor de verslaglegging van piekaanpassing bij röntgenfotoelektrektron spectroscopie

98,05

Over deze norm

Status Definitief
Aantal pagina's 22
Gepubliceerd op 15-11-2015
Taal Engels
ISO 19830 is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

Details

ICS-code 71.040.40
Nederlandse titel Chemische analyse van oppervlakken - Electron spectroscopies - Mimimale eisen voor de verslaglegging van piekaanpassing bij röntgenfotoelektrektron spectroscopie
Engelse titel Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
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