ISO 22493:2014 en

Microstralenanalyse - Scanning elektronische microscopie - Woordenlijst


Over deze norm

Status Definitief
Aantal pagina's 20
Commissie Microstralen analyse
Gepubliceerd op 15-04-2014
Taal Engels
This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate. This International Standard is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of this International Standard are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.


ICS-code 01.040.37
Nederlandse titel Microstralenanalyse - Scanning elektronische microscopie - Woordenlijst
Engelse titel Microbeam analysis - Scanning electron microscopy - Vocabulary



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