Norm

ISO 23830:2008 en

Chemische analyse van oppervlakken - Secundaire ionen-massaspectrometrie - Herhaalbaarheid en constantheid van de relatieve intensiteitsschaal en statische secondaire ionen-massaspectrometry

48,19

Over deze norm

Status Definitief
Aantal pagina's 12
Gepubliceerd op 15-11-2008
Taal Engels
This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

Details

ICS-code 71.040.40
Nederlandse titel Chemische analyse van oppervlakken - Secundaire ionen-massaspectrometrie - Herhaalbaarheid en constantheid van de relatieve intensiteitsschaal en statische secondaire ionen-massaspectrometry
Engelse titel Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
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