Norm

ISO 8769-2:1996 en

Reference sources for the calibration of surface contamination monitors - Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV

  • Deze norm is ingetrokken sinds 08-09-2010

48,19

Over deze norm

Status Ingetrokken
Aantal pagina's 11
Gepubliceerd op 21-11-1996
Taal Engels
Specifies the characteristics of reference sources for the calibration of surface contamination monitors that are traceable to national measurement standards. Relates to a series of sources emitting electrones of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

Details

ICS-code 17.240
Nederlandse titel Reference sources for the calibration of surface contamination monitors - Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV
Engelse titel Reference sources for the calibration of surface contamination monitors - Part 2: Electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV
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