Norm

ISO/DIS 16410-1:2016 en

Electronic fee collection - Evaluation of equipment for conformity to ISO 17575-3 - Part 1: Test suite structure and test purposes

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Over deze norm

Status Ontwerp
Aantal pagina's 178
Commissie Vervoerstelematica
Gepubliceerd op 22-11-2016
Taal Engels
The scope of ISO 16410 standards is to provide a suite of tests in order to assess the Front End and Back End behaviours compliancy towards the requirements listed in ISO 17575-3. This document contains the definition of such tests in the form of Test Purposes, listing the required initial conditions, references and individual steps in a structured textual manner. The part 2 of ISO 16410 contains the identical tests written in Testing and Test Contron Notation version 3 (TTCN v3). Test Purposes defined in this document are reflecting the structural and semantical requirements stated in ISO 17575-3: - Presence / Absence of particular data elements (see ISO 17575-3, sub-clause 8.5.5) - Semantics related to various data elements, e.g.: - Activation of context data and handling multiple contexts (see ISO 17575-3, clause 8.3) - Handling the precedence and priority levels (see ISO 17575-3, sub-clause 8.5.2 - 8.5.4) - Uniqueness of relevant data elements (see ISO 17575-3, sub-clause 8.5.2 - 8.5.4) - Correct definition of the charge objects (see ISO 17575-3, sub-clause 8.5.4) - Fee calculation algorithm (see ISO 17575-3, sub-clause 8.5.3.7) - Security (see ISO 17575-3, clause 7.2) With regards to the individual data sets and EFC attributes defined in ISO 17575-3, the Test Purposes have been organised into the test suite groups, designated for the Front End and Back End respectively. Besides the Test Purposes, this document also provides proforma conformance test reports templates for both the Front End and Back End Test Purposes and an informative statement on the usage of this document for the EETS.

Details

ICS-code 03.220.20
35.240.60
Engelse titel Electronic fee collection - Evaluation of equipment for conformity to ISO 17575-3 - Part 1: Test suite structure and test purposes
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