Norm

ISO/DIS 17915:2017 en

Optics and photonics - Measurement method of semiconductor lasers for sensing

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Status Ontwerp
Aantal pagina's 30
Commissie Intra-oculaire lenzen en contactlenzen
Gepubliceerd op 12-04-2017
Taal Engels
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Details

ICS-code 31.260
Nederlandse titel Optics and photonics - Measurement method of semiconductor lasers for sensing
Engelse titel Optics and photonics - Measurement method of semiconductor lasers for sensing

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