Norm

ISO/DIS 19668:2016 en

Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials

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Over deze norm

Status Ontwerp
Aantal pagina's 19
Gepubliceerd op 11-12-2016
Taal Engels
This International Standard specifies a procedure by which elemental detection limits in X-ray Photoelectron Spectroscopy (XPS) may be estimated from data for a particular sample and reported. This International Standard is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.

Details

ICS-code 71.040.40
Nederlandse titel Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials
Engelse titel Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials

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